ellipsometry
英[elɪp'sɒmɪtrɪ]||||||美[ɪlep'sɒmətrɪ]
- 1 . The measuring condition for principle angle in spectroscopic ellipsometry is analyzed.
- 对椭圆偏振光谱中的主角测量条件进行了分析.
来自互联网
- 2 . Angle of incidence and wave length for ellipsometry method were studied.
- 对椭圆偏振法的入射角和波长进行了探讨.
来自互联网
- 3 . A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced.
- 探讨了利用普通光谱型椭偏仪对各向异性液晶层进行综合性测量的可行性.
来自互联网
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英语单词,1
英[elɪp'sɒmɪtrɪ]
美[ɪlep'sɒmətrɪ]
- n.椭圆光度法，椭圆偏光法，椭圆对称法
网络解释.椭圆光度法；椭圆测量术；椭圆偏振术；椭圆偏振
双语例句
- 1 . The measuring condition for principle angle in spectroscopic ellipsometry is analyzed.
- 对椭圆偏振光谱中的主角测量条件进行了分析.
来自互联网
- 2 . Angle of incidence and wave length for ellipsometry method were studied.
- 对椭圆偏振法的入射角和波长进行了探讨.
来自互联网
- 3 . A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced.
- 探讨了利用普通光谱型椭偏仪对各向异性液晶层进行综合性测量的可行性.
来自互联网